iridescent tones reveal sub nanometer defects semiconductor fabrication |
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| navigate by keyword : quantum metrology sapphire wafer defect detection holographic interferometry iridescent semiconductor inspection precision fabrication nanometer holography interference optics technology advanced industrial manufacturing surface analysis reveal defects |
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| Showcases precise defect detection on a sapphire wafer using quantum metrology, highlighted by holographic interferometry in shimmering, iridescent colors. |
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